Toronto - Optech issued an initial call for presentations for the third Imaging and LiDAR Solutions Conference (ILSC) to be held in Toronto on June 25-27, 2013.
Optech's ILSC 2013 is an open forum for industry
professionals to meet and network to discuss best practices and real-world LiDAR
and imaging solutions. Topics of interest will include enhanced efficiencies
and productivity through sensor refinements, and new integrated solutions that
include real-time displays for complete coverage verification, multi-sensor
flight planning and processing software.
“The ILSC conferences are of great value for our existing and potential
clients as well as for the surveying and mapping industries more generally,"
says Maxime Elbaz, president of Optech. "New technologies are developing
so rapidly that it's important to have an open forum to explore how they can be
exploited most efficiently. More and more our customers need to be productive
with integrated systems-LiDARs and cameras-which is where Optech is focused as
well. Everyone is grappling with how to turn exciting new capabilities into
profitable opportunities and, ultimately, into tested workflows that deliver a
potential users of Optech technologies are welcome to submit abstracts. More
information is available on Optech's website at
Optech Announces ILSC 2013 Call for Presentations
January 15, 2013