Optech Releases ZinView Update

September 4, 2006
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Toronto, August 29, 2006 - Optech Incorporated, the global leader in the development and manufacture of lidar survey instruments, is pleased to announce an update of its extremely popular ZinView software: ZinView, version 3.2.

ZinView enables you to process data quickly and check for gaps and other errors without having to take the data into REALM for full processing. ZinView data processing is fast and efficient, with a ratio of better than 1:1. It features easy setup, simple point and click operation, and a viewer with full rotation and zoom capabilities.

ZinView 3.2 now offers new min/max range and scan angle cut-off filters, DXF file import (shape file), camera footprint calculation in 3D mode, LAS output supports for four pulses (ALTM models 30/70 or 3100) and Optech's open source IXF format for ground based 3D lidar scanners (such as the ILRIS-3D family of scanners from Optech). It also has real-time best estimate trajectory (RBET) that can be generated in POSPac or TerraPhoto format.

"ZinView has proven to be a real asset for airborne lidar operators since it was launched," said Brent Gelhar, Director of the Optech's Terrestrial Survey Division. "And this latest release adds full support for an entirely new class of lidar scanners, together with powerful enhancements that have been implemented as a result of our very close cooperation with customers."

More information about Zinview 3.2 can be found on our website. A 30-day free trial version of ZinView, and the fully licensed version, are available on the Optech FTP download site: dowload/software/Zinview.

About Optech

Optech is the world leader in the development, manufacture and support of advanced laser-based survey instruments. The company offers client-driven solutions in airborne terrestrial mapping, airborne laser bathymetry, 3D laser imaging, space-based atmospheric monitors, spaceborne landing/docking systems, mine cavity monitoring systems, and industrial process control equipment.

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